EE 692 - Guided Waves and Material Measurements

Fall 2010

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EE 692 Course Syllabus 

Lecture Notes and Related Materials

• Lecture 1. Overview of course. Maxwell's equations. Boundary conditions. (Baker-Jarvis paper)
• Lecture 2. Basic properties of dielectric materials. (Supplement on types of polarization.)
• Lecture 3. Basic properties of magnetic materials.
• Lecture 4. Material properties in AC fields. (Table 10.1 from Solymar and Walsh. Figs. 9.15 and 9.16 from Bohren and Huffman.)
• Lecture 5. Lossy transmission lines.
• Lecture 6. Short circuited line measurements.
• Lecture 7. Methods for extracting material parameters from measured data.
• Lecture 8. Open-ended coaxial probes. (Misra paper)
• Lecture 9. Transmission-reflection measurements for e and m.
• Lecture 10. Nicolson-Ross-Weir (NRW) and Baker-Jarvis algorithms (Nicolson and Ross paper, Weir paper, Baker-Jarvis paper).
• Lecture 11. Types of EM modes in metallic waveguides. TE^z and TM^z modes in rectangular waveguides.
• Lecture 12. General behavior of rectangular waveguides.
• Lecture 13. TE10 mode in rectangular waveguides. Guide wavelength. Bouncing ray model.
• Lecture 14. Equivalent voltage, current, and impedance for waveguides.
• Lecture 15. Orthogonality properties of modes in waveguides.
• Lecture 16. Extracting material parameters from rectangular waveguide measurements.
• Lecture 17. Step discontinuities in rectangular waveguides.
• Lecture 18. H-plane step discontinuity in a rectangular waveguide.
• Lecture 19. Transmission line resonators.
• Lecture 20. Rectangular waveguide resonant cavities.
• Lecture 21. Material measurement by resonant cavity perturbation.
• Lecture 22. Wave equation in the circular cylindrical coordinate system. Properties of Bessel functions.
• Lecture 23. TE^z and TM^z modes in circular waveguides.
• Lecture 24. Higher ordered modes in coaxial waveguides.
• Lecture 25. Circular waveguide resonant cavities.
• Lecture 26. Artificial electromagnetic materials. Local, microscopic, and macroscopic fields. Clausius-Mossotti/Lorenz-Lorentz formula. (Aspnes paper)
• Lecture 27. Mixing formulas: Lorentz-Lorenz, Maxwell Garnett, and Bruggeman equations. (Sihvola paper)
• Lecture 28. Applications and uses of the Maxwell Garnett mixing formula. (Whites paper, Whites and Wu paper, Metamaterials '2009 presentation)
• Lecture 29. Applications and uses of the Bruggeman mixing formula (effective medium approximation). (Chung paper, Metamaterials '2008 presentation)

Homework Problems and Solutions

• Homework #1. Assigned Sept. 15. Due Sept. 28.
• Homework #2. Assigned Sept. 15. Due Sept. 28.
• Homework #3. Assigned Oct. 5. Due Oct. 19.
• Homework #4. Assigned Nov. 4. Due Nov. 16.

Laboratory Assignments

• Laboratory report grading sheet.
• Laboratory Assignment #1.
• Laboratory Assignment #2.
• Final project.

Useful References 

• User's and Service Guide: X, P, and K Waveguide Calibration Kits, Agilent Technologies 11644-90371, Oct. 2002.
• Basics of Measuring the Dielectric Properties of Materials, Agilent Application Note 5989-2589EN, April 28, 2005.
• J. Baker-Jarvis, M. D. Janezic, J. H. Grosvenor Jr. and R. G. Geyer, "Transmission/reflection and short-circuit line permittivity measurements," National Institute of Standards and Technology, NIST Technical Note 1341, July 1990.
• J. Baker-Jarvis, M. D. Janezic, J. H. Grosvenor Jr. and R. G. Geyer, "Transmission/reflection and short-circuit line methods for measuring permittivity and permeability," National Institute of Standards and Technology, NIST Technical Note 1335-R, Dec. 1993.
• J. Baker-Jarvis, M. Janezic, B. Riddle, C. Holloway, N. Paulter and J. Blendell, "Dielectric and conductor-loss characterization and measurements on electronic packaging materials," National Institute of Standards and Technology, NIST Technical Note 1520, 2001.
• J. Baker-Jarvis, M. D. Janezic, B. F. Riddle, R. T. Johnk, P. Kabos, C. L. Holloway, R. G. Geyer and C. A. Grosvenor, "Measuring the permittivity and permeability of lossy materials: Solid, liquids, metals, building materials, and negative-index materials," National Institute of Standards and Technology, NIST Technical Note 1536, Dec. 2004.

K. W. Whites

Last modified on December 22, 2010